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Flat panel X-ray detector with reduced internal scattering for improved attenuation accuracy and dynamic range

United States Patent

October 12, 2010
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
An x-ray detector is disclosed that has had all unnecessary material removed from the x-ray beam path, and all of the remaining material in the beam path made as light and as low in atomic number as possible. The resulting detector is essentially transparent to x-rays and, thus, has greatly reduced internal scatter. The result of this is that x-ray attenuation data measured for the object under examination are much more accurate and have an increased dynamic range. The benefits of this improvement are that beam hardening corrections can be made accurately, that computed tomography reconstructions can be used for quantitative determination of material properties including density and atomic number, and that lower exposures may be possible as a result of the increased dynamic range.
Smith; Peter D. (Santa Fe, NM), Claytor; Thomas N. (White Rock, NM), Berry; Phillip C. (Albuquerque, NM), Hills; Charles R. (Los Alamos, NM)
The United Sttes of America as represented by the United States Department of Energy (Washington, DC), N/A (
12/ 040,180
February 29, 2008
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The United States Government has rights in this invention pursuant to Contract No. W-7405-ENG-36 between the United States Department of Energy National Nuclear Security Administration and Los Alamos National Security, LLC for the operation of Los Alamos National Laboratory.