Skip to Content
Find More Like This
Return to Search

Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry

United States Patent

7,768,639
August 3, 2010
View the Complete Patent at the US Patent & Trademark Office
U.S. Department of Energy - Visit the Office of the Assistant General Counsel for Technology Transfer & Intellectual Property Website
A method for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry (ICP-AES). ICP-AES analysis is performed across a plurality of selected locations in the plasma on an unknown sample, collecting the light intensity at one or more selected wavelengths of one or more sought-for analytes, creating a first dataset. The first dataset is then calibrated with a calibration dataset creating a calibrated first dataset curve. If the calibrated first dataset curve has a variability along the location within the plasma for a selected wavelength, errors are present. Plasma-related errors are then corrected by diluting the unknown sample and performing the same ICP-AES analysis on the diluted unknown sample creating a calibrated second dataset curve (accounting for the dilution) for the one or more sought-for analytes. The cross-over point of the calibrated dataset curves yields the corrected value (free from plasma related errors) for each sought-for analyte.
Chan; George C. Y. (Bloomington, IN), Hieftje; Gary M. (Bloomington, IN)
The United States of America as represented by the United States Department of Energy (Washington, DC), N/A (
12/ 212,915
September 18, 2008
GOVERNMENT INTERESTS The United States Government has rights in this invention pursuant to Contract No. DE-FG02-98ER14890, between the U.S. Department of Energy (DOE) and Indiana University.