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Vicinal light inspection of translucent materials

United States Patent

January 19, 2010
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
The present invention includes methods and apparatus for inspecting vicinally illuminated non-patterned areas of translucent materials. An initial image of the material is received. A second image is received following a relative translation between the material being inspected and a device generating the images. Each vicinally illuminated image includes a portion having optimal illumination, that can be extracted and stored in a composite image of the non-patterned area. The composite image includes aligned portions of the extracted image portions, and provides a composite having optimal illumination over a non-patterned area of the material to be inspected. The composite image can be processed by enhancement and object detection algorithms, to determine the presence of, and characterize any inhomogeneities present in the material.
Burns; Geroge R. (Albuquerque, NM), Yang; Pin (Albuquerque, NM)
Sandia Corporation (Alburquerque, NM)
12/ 328,472
December 4, 2008
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The United States Government has certain rights in this invention pursuant to Department of Energy Contract No. DE-AC04-94AL85000 with Sandia Corporation.