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On-Chip AC self-test controller

United States Patent

September 29, 2009
View the Complete Patent at the US Patent & Trademark Office
Lawrence Livermore National Laboratory - Visit the Industrial Partnerships Office Website
A system for performing AC self-test on an integrated circuit that includes a system clock for normal operation is provided. The system includes the system clock, self-test circuitry, a first and second test register to capture and launch test data in response to a sequence of data pulses, and a logic circuit to be tested. The self-test circuitry includes an AC self-test controller and a clock splitter. The clock splitter generates the sequence of data pulses including a long data capture pulse followed by an at speed data launch pulse and an at speed data capture pulse followed by a long data launch pulse. The at speed data launch pulse and the at speed data capture pulse are generated for a common cycle of the system clock.
Flanagan; John D. (Rhinebeck, NY), Herring; Jay R. (Poughkeepsie, NY), Lo; Tin-Chee (Fishkill, NY)
International Business Machines Corporation (Armonk, NY)
12/ 185,172
August 4, 2008
GOVERNMENT RIGHTS This invention was made with Government support under subcontract B338307 under prime contract W-7405-ENG-48 awarded by the Department of Energy. The Government has certain rights in this invention.