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High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals

United States Patent

December 23, 2008
View the Complete Patent at the US Patent & Trademark Office
Argonne National Laboratory - Visit the Technology Development and Commercialization Website
A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.
Smither; Robert K. (Hinsdale, IL)
UChicago Argonne, LLC (Chicago, IL)
11/ 479,797
June 30, 2006
CONTRACTUAL ORIGIN OF INVENTION The United States Government has rights to this invention pursuant to Contract No. W-31-109-ENG-38 between the U.S. Department of Energy and the University of Chicago, representing Argonne National Laboratory.