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Design structure for in-system redundant array repair in integrated circuits

United States Patent

November 25, 2008
View the Complete Patent at the US Patent & Trademark Office
Lawrence Livermore National Laboratory - Visit the Industrial Partnerships Office Website
A design structure for repairing an integrated circuit during operation of the integrated circuit. The integrated circuit comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The design structure provides the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The design structure further passes the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.
Bright; Arthur A. (Croton-on-Hudson, NY), Crumley; Paul G. (Yorktown Heights, NY), Dombrowa; Marc (Bronx, NY), Douskey; Steven M. (Rochester, MN), Haring; Rudolf A. (Cortlandt Manor, NY), Oakland; Steven F. (Colchester, VT), Quellette; Michael R. (Westford, VT), Strissel; Scott A. (Byron, MN)
International Business Machines Corporation (Armonk, NY)
11/ 851,613
September 7, 2007
This invention was made with Government support under Subcontract B517552 under prime contract W-7405-ENG-48 awarded by the Department of Energy. The Government has certain rights in this invention.