Skip to Content
Find More Like This
Return to Search

Method and system for an on-chip AC self-test controller

United States Patent

7,430,698
September 30, 2008
View the Complete Patent at the US Patent & Trademark Office
Lawrence Livermore National Laboratory - Visit the Industrial Partnerships Office Website
A method and system for performing AC self-test on an integrated circuit that includes a system clock for use during normal operation are provided. The method includes applying a long data capture pulse to a first test register in response to the system clock, applying an at speed data launch pulse to the first test register in response to the system clock, inputting the data from the first register to a logic path in response to applying the at speed data launch pulse to the first test register, applying an at speed data capture pulse to a second test register in response to the system clock, inputting the logic path output to the second test register in response to applying the at speed data capture pulse to the second test register, and applying a long data launch pulse to the second test register in response to the system clock.
Flanagan; John D. (Rhinebeck, NY), Herring; Jay R. (Poughkeepsie, NY), Lo; Tin-Chee (Fishkill, NY)
International Business Machines Corporation (Armonk, NY)
11/ 323,449
20060242509
December 30, 2005
GOVERNMENT RIGHTS This invention was made with Government support under subcontract B338307 under prime contract W-7405-ENG-48 awarded by the Department of Energy. The Government has certain rights in this invention.