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Detection of electromagnetic radiation using micromechanical multiple quantum wells structures

United States Patent

July 17, 2007
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
An apparatus and method for detecting electromagnetic radiation employs a deflectable micromechanical apparatus incorporating multiple quantum wells structures. When photons strike the quantum-well structure, physical stresses are created within the sensor, similar to a "bimetallic effect." The stresses cause the sensor to bend. The extent of deflection of the sensor can be measured through any of a variety of conventional means to provide a measurement of the photons striking the sensor. A large number of such sensors can be arranged in a two-dimensional array to provide imaging capability.
Datskos; Panagiotis G. (Knoxville, TN), Rajic; Slobodan (Knoxville, TN), Datskou; Irene (Knoxville, TN)
UT-Battelle, LLC (Oak Ridge, TN)
11/ 358,933
February 21, 2006
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH This invention was made with United States Government support under Contract No. DE-AC05-00OR22725 between the United States Department of Energy and U.T. Battelle, LLC. The United States Government has certain rights in this invention.