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Micro-tensile testing system

United States Patent

July 17, 2007
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
Wenski; Edward G. (Lenexa, KS)
Honeywell Federal Manufacturing & Technologies (Kansas City, MO)
11/ 229,111
September 16, 2005
FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT PROGRAM The U.S. Government has a paid-up license in this invention and the right in limited circumstances to require the patent owner to license others on reasonable terms as provided for by the terms of Contract No. DE-AC04-01AL66850 awarded by the U.S. Department of Energy.