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Method for non-referential defect characterization using fractal encoding and active contours

United States Patent

7,218,772
May 15, 2007
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.
Gleason; Shaun S. (Knoxville, TN), Sari-Sarraf; Hamed (Lubbock, TX)
Ut-Battelle LLC (Oak Ridge, TN)
10/ 166,296
20030228051
June 10, 2002
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The United States Government has rights in this invention pursuant to Contract No. DE-AC05-00OR22725 between the United States Department of Energy and UT-Battelle, LLC.