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Method for measuring thermal properties using a long-wavelength infrared thermal image

United States Patent

January 30, 2007
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
A method for estimating the thermal properties of surface materials using long-wavelength thermal imagery by exploiting the differential heating histories of ground points in the vicinity of shadows. The use of differential heating histories of different ground points of the same surface material allows the use of a single image acquisition step to provide the necessary variation in measured parameters for calculation of the thermal properties of surface materials.
Walker; Charles L. (Albuquerque, NM), Costin; Laurence S. (Albuquerque, NM), Smith; Jody L. (Albuquerque, NM), Moya; Mary M. (Albuquerque, NM), Mercier; Jeffrey A. (Albuquerque, NM)
Sandia Corporation (Albuquerque, MN)
11/ 215,722
August 30, 2005
The United States Government has rights in this invention pursuant to Department of Energy Contract No. DE-AC04-94AL85000 with Sandia Corporation.