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Vertically aligned nanostructure scanning probe microscope tips

United States Patent

December 19, 2006
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.
Guillorn; Michael A. (Knoxville, TN), Ilic; Bojan (Ithaca, NY), Melechko; Anatoli V. (Oak Ridge, TN), Merkulov; Vladimir I. (Knoxville, TN), Lowndes; Douglas H. (Knoxville, TN), Simpson; Michael L. (Knoxville, TN)
UT-Battelle, LLC (Oak Ridge, TN)
10/ 716,770
November 19, 2003
STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY-SPONSORED RESEARCH OR DEVELOPMENT This invention was made with United States Government support under prime contract No. DE-AC05-00OR22725 to UT-Battelle, L.L.C. awarded by the Department of Energy. The Government has certain rights in this invention.