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Photothermal imaging scanning microscopy

United States Patent

July 11, 2006
View the Complete Patent at the US Patent & Trademark Office
Lawrence Livermore National Laboratory - Visit the Industrial Partnerships Office Website
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.
Chinn; Diane (Pleasanton, CA), Stolz; Christopher J. (Lathrop, CA), Wu; Zhouling (Pleasanton, CA), Huber; Robert (Discovery Bay, CA), Weinzapfel; Carolyn (Tracy, CA)
The United States of America as represented by the United States Department of Energy (Washington, DC), N/A (
10/ 402,604
March 28, 2003
The United States Government has rights in this invention pursuant to Contract No. W-7405-ENG-48 between the United States Department of Energy and the University of California for the operation of Lawrence Livermore National Laboratory.