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Method and system for an on-chip AC self-test controller

United States Patent

7,058,866
June 6, 2006
View the Complete Patent at the US Patent & Trademark Office
Lawrence Livermore National Laboratory - Visit the Industrial Partnerships Office Website
A method for performing AC self-test on an integrated circuit, including a system clock for use during normal operation. The method includes applying a long data capture pulse to a first test register in response to the system clock, and further applying at an speed data launch pulse to the first test register in response to the system clock. Inputting the data from the first register to a logic path in response to applying the at speed data launch pulse to the first test register. Applying at speed data capture pulse to a second test register in response to the system clock. Inputting the output from the logic path to the second test register in response to applying the at speed data capture pulse to the second register. Applying a long data launch pulse to the second test register in response to the system clock.
Flanagan; John D. (Rhinebeck, NY), Herring; Jay R. (Poughkeepsie, NY), Lo; Tin-Chee (Fishkill, NY)
International Business Machines Corporation (Armonk, NY)
10/ 131,554
20030204800
April 24, 2002
GOVERNMENT RIGHTS This invention was made with Government support under subcontract B338307 under prime contract W-7405-ENG-48 awarded by the Department of Energy. The Government has certain rights in this invention.