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Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays

United States Patent

September 20, 2005
View the Complete Patent at the US Patent & Trademark Office
Brookhaven National Laboratory - Visit the Office of Technology Commercialization and Partnerships Website
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.
Wernick; Miles N. (Chicago, IL), Chapman; Leroy Dean (Bolingbrook, IL), Oltulu; Oral (Chicago, IL), Zhong; Zhong (Stony Brook, NY)
Illinois Institute of Technology (Chicago, IL)
10/ 463,827
June 17, 2003
This work was supported in part by U.S. Army Grant DAMD 17-99-1-927; U.S. Department of Energy Contract DE-AC02-76CH00016; State of Illinois Higher Education Cooperative Agreement; and National Institutes of Health Grants GM59395 and AR48292.