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Method for determining formation quality factor from seismic data

United States Patent

August 16, 2005
View the Complete Patent at the US Patent & Trademark Office
A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.
Taner; M. Turhan (Houston, TX), Treitel; Sven (Tulsa, OK)
RDSPI, L.P. (Houston, TX)
10/ 687,129
October 16, 2003
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The present invention was made pursuant to contract number DE-FC26-01BC15356 with the United States Department of Energy. The United States Government retains certain rights in the invention.