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Line sensing device for ultrafast laser acoustic inspection using adaptive optics

United States Patent

6,643,005
November 4, 2003
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
Apparatus and method for inspecting thin film specimens along a line. A laser emits pulses of light that are split into first, second, third and fourth portions. A delay is introduced into the first portion of pulses and the first portion of pulses is directed onto a thin film specimen along a line. The third portion of pulses is directed onto the thin film specimen along the line. A delay is introduced into the fourth portion of pulses and the delayed fourth portion of pulses are directed to a photorefractive crystal. Pulses of light reflected from the thin film specimen are directed to the photorefractive crystal. Light from the photorefractive crystal is collected and transmitted to a linear photodiode array allowing inspection of the thin film specimens along a line.
Hale; Thomas C. (Santa Fe, NM), Moore; David S. (Santa Fe, NM)
The Regents of the University of California (Los Alamos, NM)
10/ 096,166
March 12, 2002
The present invention generally relates to inspection of manufactured articles, and, more particularly, to laser acoustic inspection devices. This invention was made with Government support under Contract No. W-7405-ENG36 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.