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Beam position monitor

United States Patent

July 22, 2003
View the Complete Patent at the US Patent & Trademark Office
Argonne National Laboratory - Visit the Technology Development and Commercialization Website
An apparatus for determining the position of an x-ray beam relative to a desired beam axis. Where the apparatus is positioned along the beam path so that a thin metal foil target intersects the x-ray beam generating fluorescent radiation. A PIN diode array is positioned so that a portion of the fluorescent radiation is intercepted by the array resulting in an a series of electrical signals from the PIN diodes making up the array. The signals are then analyzed and the position of the x-ray beam is determined relative to the desired beam path.
Alkire; Randy W. (Naperville, IL), Rosenbaum; Gerold (Homer Township, IL), Evans; Gwyndaf (Cambridge, GB)
The United States of America as represented by the United States Department of Energy (Washington, DC)
09/ 665,958
September 21, 2000
CONTRACTUAL ORIGIN OF THE INVENTION The United States Government has rights in this invention pursuant to Contract No. W-31-109-ENG-38 between the U.S. Department of Energy and the University of Chicago.