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Data processing device test apparatus and method therefor

United States Patent

April 8, 2003
View the Complete Patent at the US Patent & Trademark Office
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A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.
Wilcox; Richard Jacob (Austin, TX), Mulig; Jason D. (Austin, TX), Eppes; David (Austin, TX), Bruce; Michael R. (Austin, TX), Bruce; Victoria J. (Austin, TX), Ring; Rosalinda M. (Austin, TX), Cole, Jr.; Edward I. (New Bernalillo, NM), Tangyunyong; Paiboon (Bernalillo, NM), Hawkins; Charles F. (Bernalillo, NM), Louie; Arnold Y. (Santa Clara, CA)
Advanced Micro Devices (Austin, TX)
09/ 586,572
June 2, 2000
GOVERNMENT RIGHTS This invention was made with government support under contract number DE-AC04-94-AL85000 awarded by the U.S. Department of Energy. The U.S. Government has certain rights in the invention.