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Apparatus and method for measuring the thickness of a coating

United States Patent

April 2, 2002
View the Complete Patent at the US Patent & Trademark Office
Idaho National Laboratory - Visit the Technology Transfer and Commercialization Office Website
An apparatus and method for measuring the thickness of a coating adhered to a substrate. An electromagnetic acoustic transducer is used to induce surface waves into the coating. The surface waves have a selected frequency and a fixed wavelength. Interpolation is used to determine the frequency of surface waves that propagate through the coating with the least attenuation. The phase velocity of the surface waves having this frequency is then calculated. The phase velocity is compared to known phase velocity/thickness tables to determine the thickness of the coating.
Carlson; Nancy M. (Idaho Falls, ID), Johnson; John A. (Idaho Falls, ID), Tow; David M. (Idaho Falls, ID), Walter; John B (Idaho Falls, ID)
Bechtel BWXT Idaho LLC (Idaho Falls, ID)
09/ 460,041
December 13, 1999
CONTRACTUAL ORIGIN OF THE INVENTION The United States Government has rights in this invention pursuant to Contract No. DE-AC07-94ID13223 between the United States Department of Energy and Lockheed Martin Idaho Technologies Company, now Contract No. DE-AC07-991D13727 with Bechtel BWXT Idaho, LLC.