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Crystal phase identification

United States Patent

6,326,619
December 4, 2001
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
A method and apparatus for determining the crystalline phase and crystalline characteristics of a sample. This invention provides a method and apparatus for unambiguously identifying and determining the crystalline phase and crystalline characteristics of a sample by using an electron beam generator, such as a scanning electron microscope, to obtain a backscattered electron Kikuchi pattern of a sample, and extracting crystallographic and composition data that is matched to database information to provide a quick and automatic method to identify crystalline phases.
Michael; Joseph R. (Albuquerque, NM), Goehner; Raymond P. (Albuquerque, NM), Schlienger; Max E. (Albuquerque, NM)
Sandia Corporation (Albuquerque, NM)
09/ 299,940
April 26, 1999
This invention was made with Government support under Contract No. DE-AC04-94AL85000 awarded by the Department of Energy. The Government has certain rights in the invention.