Skip to Content
Find More Like This
Return to Search

Optical method for the determination of grain orientation in films

United States Patent

6,317,216
November 13, 2001
View the Complete Patent at the US Patent & Trademark Office
A method for the determination of grain orientation in a film sample is provided comprising the steps of measuring a first transient optical response of the film and determining the contribution to the transient optical response arising from a change in the energy distribution of the electrons in the sample, determining the contribution to the transient optical response arising from a propagating strain pulse within the sample, and determining the contribution to the transient optical response arising from a change in sample temperature of the sample. The grain orientation of the sample may be determined using the contributions to the transient optical response arising from the change in the energy distribution of the electrons, the propagating strain pulse, and the change in sample temperature. Additionally, a method for determination of the thickness of a film sample is provided. The grain orientation of the sample is first determined. The grain orientation, together with the velocity of sound and a propagation time of a strain pulse through the sample are then used to determine the thickness of the film sample.
Maris; Humphrey J. (Barrington, RI)
Brown University Research Foundation (Providence, RI)
09/ 459,701
December 13, 1999
STATEMENT OF GOVERNMENT RIGHTS This invention was made with government support under Grant No. DE-FG02-86ER45267 awarded by the Department of Energy. The Government has certain rights in this invention