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Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light

United States Patent

6,097,488
August 1, 2000
View the Complete Patent at the US Patent & Trademark Office
A method and apparatus for measuring microstructures, anistropy and birefringence in polymers using laser scattered light includes a laser which provides a beam that can be conditioned and is directed at a fiber or film which causes the beam to scatter. Backscatter light is received and processed with detectors and beam splitters to obtain data. The data is directed to a computer where it is processed to obtain information about the fiber or film, such as the birefringence and diameter. This information provides a basis for modifications to the production process to enhance the process.
Grek; Boris (Santa Clara, CA), Bartolick; Joseph (Livermore, CA), Kennedy; Alan D. (Wilmington, DE)
Princeton University (Princeton, NJ)
09/ 102,254
June 22, 1998
GOVERNMENT RIGHTS The present invention has been made under the contract with the Department of Energy and the government may have certain rights to the subject invention.