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Method and apparatus for measuring film spectral properties

United States Patent

December 21, 1999
View the Complete Patent at the US Patent & Trademark Office
Film spectral properties are measured by projecting chopped monochromatic light onto a luminescent film sample deposited on a substrate, and coupling through use of immersion oil the reflection of light therefrom to a light detector.
Forrest; Stephen R. (Princeton, NJ), Burrows; Paul E. (Princeton, NJ), Garbuzov; Dmitri Z. (Princeton, NJ), Bulovic; Vladimir (Metuchen, NJ)
The Trustees of Princeton University (Princeton, NJ)
08/ 936,922
September 25, 1997
GOVERNMENT LICENSE RIGHTS This invention was made with Government support under NREL subcontract number XAI-3-11167-03, awarded by the Department of Energy. The government has certain rights in this invention.