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Measuring short electron bunch lengths using coherent smith-purcell radiation

United States Patent

5,889,797
March 30, 1999
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
A method is provided for directly determining the length of sub-picosecond electron bunches. A metallic grating is formed with a groove spacing greater than a length expected for the electron bunches. The electron bunches are passed over the metallic grating to generate coherent and incoherent Smith-Purcell radiation. The angular distribution of the coherent Smith-Purcell radiation is then mapped to directly deduce the length of the electron bunches.
Nguyen; Dinh C. (Los Alamos, NM)
The Regents of the University of California (Los Alamos, NM)
08/ 915,240
August 20, 1997
This invention was made with government support under Contract No. W-7405-ENG-36 awarded by the U.S. Department of Energy. The government has certain rights in the invention.