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Method and apparatus for measuring current density in conductive materials

United States Patent Application

20090006015
A1
View the Complete Application at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
The present invention relates to an apparatus and method for measuring a current density in a conductive material. The apparatus and method use an algorithm and an extension to the Fourier transform approach that allows transport currents to be treated accurately. Due to its speed, the resulting algorithm is ideally suited for high-resolution and high-throughput magnetic imaging of superconducting tape in real time.
Mueller, Frederick M. (Los Alamos, NM), Grube, Holger (Gaithersburg, MD), Brown, Geoffrey W. (Los Alamos, NM), Hawley, Marilyn E. (Los Alamos, NM), Coulter, J. Yates (Santa Fe, NM)
11/ 824,650
June 29, 2007
STATEMENT REGARDING FEDERAL RIGHTS [0001] This invention was made with government support under Contract No. DE-AC52-06NA25396, awarded by the U.S. Department of Energy. The government has certain rights in the invention.