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NMR CHARACTERIZATION OF THIN FILMS

United States Patent Application

*** PATENT GRANTED ***
20080309337
7,737,691
A1
View the Complete Application at the US Patent & Trademark Office
Argonne National Laboratory - Visit the Technology Development and Commercialization Website
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
GERALD, II, Rex E. (Brookfield, IL), Klingler, Robert J. (Glenview, IL), Rathke, Jerome W. (Homer Glen, IL), Diaz, Rocio (Chicago, IL), Vukovic, Lela (Westchester, IL)
U Chicago Argonne LLC
12/ 198,724
August 26, 2008
GOVERNMENT INTEREST [0002] The United States Government has certain rights in the invention pursuant to Contract No. W-31-109-ENG-38 between the U.S. Department of Energy and the University of Chicago operating Argonne National Laboratory.