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Time-of-flight secondary ion mass spectrometer mapping of cells and tissue

United States Patent Application

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A method of analyzing a cell. A finely focused energetic primary-ion beam of a time-of-flight secondary ion mass spectrometer is directed to the cell. Interrogating at least one region of interest area from the cell and producing data. Distributing the data in plots indicating measures of similarity.
Kulp, Kristen S. (Livermore, CA), Wu, Kuang Jen J. (Cupertino, CA), Knize, Mark G. (Tracy, CA), Felton, James S. (Danville, CA)
The Regents of the University of California
11/ 633,997
December 4, 2006
[0002] The United States Government has rights in this invention pursuant to Contract No. W-7405-ENG48 between the United States Department of Energy and the University of California for the operation of Lawrence Livermore National Laboratory.