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Method and apparatus for orthopedic implant assessment

United States Patent Application

20070089518
A1
View the Complete Application at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Methods and apparatus are described for orthopedic implant assessment. A method includes characterizing wear of an orthopedic implant including measuring a dimension in a direction that defines a path that passes through an articulating surface of a wear element of the orthopedic implant using at least one thickness sensor. An apparatus includes an orthopedic implant including a wear element having an articulating surface; and at least one thickness sensor coupled to the wear element, the at least one thickness sensor measuring a dimension in a direction that defines a path that passes through the articulating surface of the wear element. A method includes characterizing forces within an orthopedic implant including using a plurality of individually addressable pressure sensors including measuring parasitic impedance between at least two of the plurality of individually addressable pressure sensors.
Ericson, Milton Nance (Knoxville, TN), Britton, Charles Lanier (Alcoa, TN), Baba, Justin Shekwoga (Knoxville, TN), Warmack, Robert J. (Knoxville, TN)
11/ 259,815
October 26, 2005
STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY-SPONSORED RESEARCH OR DEVELOPMENT [0001] This invention was made with United States Government support under prime contract No. DE-AC05-00OR22725 to UT-Battelle, L.L.C. awarded by the Department of Energy. The Government has certain rights in this invention.