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SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS

United States Patent Application

20180025887
A1
View the Complete Application at the US Patent & Trademark Office
Pacific Northwest National Laboratory - Visit the Technology Commercialization Program Website
Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
Kovarik, Libor (West Richland, WA), Stevens, Andrew J. (Richland, WA), Liyu, Andrey V. (Pasco, WA), Browning, Nigel D. (Richland, WA)
BATTELLE MEMORIAL INSTITUTE (Richland WA)
15/ 643,862
July 7, 2017
ACKNOWLEDGEMENT OF GOVERNMENT SUPPORT [0002] This invention was made with Government support under Contract DE-AC0576RL01830 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.