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CTIR SPECTROMETER FOR LARGE AREA ASSESSMENT OF GAS EMISSIONS

United States Patent Application

20170322383
A1
View the Complete Application at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Systems for determining the presence and distribution of gas emissions in an area are provided. For example, a system may include one or more light detectors and one or more reflectors and/or one more retroreflectors disposed around the perimeter, a light source configured to emit light at a plurality of wavelengths towards the one or more light detectors and/or the one or more reflectors and/or one or more retroreflectors, and one or more processors configured to receive information representing light intensity detected by the one or more light detectors, respectively at each of the plurality of wavelengths and determine gases present in each path based on the light intensity detected by the respective detector at each of the plurality of wavelengths and distribution thereof. The path being either light source-respective detector, light source-respective reflector-respective detector or light source-respective retroreflector-respective detector. Other system may not use reflectors and/or retroreflectors.
Bingham, Philip R. (Knoxville, TN), Datskos, Panagiotis G. (Knoxville, TN), Phelps, Tommy J. (Knoxville, TN), Tobin, JR., Kenneth W. (Harriman, TN)
15/ 586,085
May 3, 2017
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH AND DEVELOPMENT [0002] This invention was made with government support under Contract No. DE-AC05-00OR22725 awarded by the U.S. Department of Energy. The government has certain rights in the invention.