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X-Ray Spectrometer with Source Entrance Slit

United States Patent Application

20170184520
A1
View the Complete Application at the US Patent & Trademark Office
An example spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle and a sample stage configured to support a sample such that the sample is offset from the Rowland circle. The spectrometer further includes an x-ray source aligned to emit x-rays toward the sample and an entrance slit formed within a material that is opaque to x-rays. The entrance slit is fixedly coupled to the x-ray source such that the entrance slit defines a range of angles at which x-rays that are emitted by the sample and pass through the entrance slit are incident on the crystal analyzer. The spectrometer further includes a position-insensitive x-ray detector aligned to detect x-rays that are scattered by the crystal analyzer.
Mortensen, Devon R. (Seattle, WA), Seidler, Gerald Todd (Seattle, WA)
15/ 392,430
December 28, 2016
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT [0002] This invention was made with government support under Contract Numbers DE-FG02-09ER16106 and DE-SC0008580, awarded by the Department of Energy. The government has certain rights in the invention.