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SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

United States Patent Application

20170103879
A1
View the Complete Application at the US Patent & Trademark Office
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
Cooks, Robert Graham (West Lafayette, IN), Baird, Zane (West Lafayette, IN), Wei, Pu (West Lafayette, IN)
15/ 317,801
June 16, 2015
GOVERNMENT SUPPORT [0002] This invention was made with government support under DE-FG02-06ER15807 awarded by the Department of Energy. The government has certain rights in the invention.