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METHOD AND SYSTEM TO SEPARATE OPTICALLY MEASURED COUPLED PARAMETERS

United States Patent Application

20170033414
A1
View the Complete Application at the US Patent & Trademark Office
A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M.sub.1 in response to light scattered by the first optical sensor, where M.sub.1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M.sub.2 in response to light scattered by the second optical sensor, where M.sub.2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M.sub.1 and M.sub.2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.
Ganguli, Anurag (Milpitas, CA), Schwartz, Julian (Palo Alto, CA), Raghavan, Ajay (Mountain View, CA), Kiesel, Peter (Palo Alto, CA), Saha, Bhaskar (Redwood City, CA), Sahu, Saroj (Fremont, CA), Sommer, Lars Wilko (Bretten, DE)
14/ 810,919
July 28, 2015
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH AND DEVELOPMENT [0001] This invention was made with government support under contract DE-AR0000274 awarded by ARPA-E (Advanced Research Projects Agency-Energy). The government has certain rights in the invention.