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United States Patent Application

View the Complete Application at the US Patent & Trademark Office
An x-ray spectrometer system comprising an x-ray imaging system with at least one achromatic imaging x-ray optic and an x-ray detection system. The optical train of the imaging system is arranged so that its object focal plane partially overlaps an x-ray emitting volume of an object. An image of a portion of the object is formed with a predetermined image magnification at the x-ray detection system. The x-ray detection system has both high spatial and spectral resolution, and converts the detected x-rays to electronic signals. In some embodiments, the detector system may have a small aperture placed in the image plane, and use a silicon drift detector to collect x-rays passing through the aperture. In other embodiments, the detector system has an energy resolving pixel array x-ray detector. In other embodiments, wavelength dispersive elements may be used in either the optical train or the detector system.
Yun, Wenbing (Walnut Creek, CA), Lewis, Sylvia Jia Yun (San Francisco, CA), Kirz, Janos (Berkeley, CA), Stripe, Benjamin Donald (Walnut Creek, CA)
Sigray, Inc. (Concord CA)
15/ 240,972
August 18, 2016
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH [0002] This Application relates to work supported in part by grant number National Science Foundation (NSF) grant numbers IIP-1448727 and IIP-1556020, both entitled "Development of a Dual Energy Micro-focused X-ray Excitation Beam for Chemical Analysis and Materials Characterization". The government may have certain rights to the invention.