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LINEAR FITTING OF MULTI-THRESHOLD COUNTING DATA

United States Patent Application

20150323687
A1
View the Complete Application at the US Patent & Trademark Office
The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.0 keV data can be analytically separated to recover the monochromatic images through simple linear fitting.
Simpson, Garth Jason (West Lafayette, IN), Muir, Ryan Douglas (West Lafayette, IN), Pogranichniy, Nicholas Roman (West Lafayette, IN)
PURDUE RESEARCH FOUNDATION (West Lafayette IN)
14/ 708,335
May 11, 2015
STATEMENT OF GOVERNMENT INTEREST [0002] This invention was made with government support under DE-AC02-06CH11357 awarded by the Department of Energy, R01GM-103401 awarded by the National Institutes of Health, and R01GM-106484 awarded by the National Institutes of Health. The government has certain rights in the invention.