Skip to Content
Find More Like This
Return to Search

Method and System for Intrinsic LED Heating for Measurement

United States Patent Application

View the Complete Application at the US Patent & Trademark Office
The present disclosure provides methods and apparatus for testing light-emitting diodes (LEDs), for example, measuring the optical radiation of an LED. In a method, a pulse-width modulated signal is provided to the LED. One or more characteristics of the PWM signal are varied so as to provide a forward voltage, V.sub.f, corresponding to a target junction temperature, T.sub.j, of the LED. The optical radiation of the LED is measured when the LED obtains the target junction temperature.
McCord, Mark (Los Gatos, CA), Guan, Yu (Pleasanton, CA), George, James (Berkeley, CA)
14/ 699,880
April 29, 2015
STATEMENT REGARDING FEDERALLY-SPONSORED RESEARCH OR DEVELOPMENT [0002] This invention was made with government support under DE-EE0005877 awarded by the U.S. Department of Energy. The government has certain rights in the invention.