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THERMOGRAPHY FOR BATTERY COMPONENT QUALITY ASSURANCE

United States Patent Application

20140294036
A1
View the Complete Application at the US Patent & Trademark Office
Methods and apparatus for the detection of irregularities in a thin film by measurement of transient thermal response.
Caruthers, James Michael (Lafayette, IN), Adams, Douglas E. (Brentwood, TN), David, Anand (Woodbury, MN), O'Regan, Peter R. (West Lafayette, IN), Sadeghi, Farshid (West Lafayette, IN), Sharp, Nathan Daniel (West Lafayette, IN), Suchomel, Mark David (Sugar Grove, IL)
Purdue Research Foundation (West Lafayette IN)
14/ 353,713
October 25, 2012
GOVERNMENT RIGHTS [0002] This invention was made with government support under Contract No. DE-EE0002494 awarded by Department of Energy. The government has certain rights in the invention.