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Angled tip for a scanning force microscope

United States Patent Application

20060042364
A1
View the Complete Application at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
A microscope probe includes a cantilever having a carbon nanostructure attached thereto at a distally oriented angle. A method of making the microscope probe can include the steps of: providing a cantilever; depositing a masking layer on a surface of the cantilever; developing a deterministic spot of the masking layer; removing the deterministic spot of the masking layer from the cantilever to form a deterministic spot of exposed cantilever; depositing a layer of nanostructure-growth catalyst directly on and in contact with the cantilever at the deterministic spot of exposed cantilever; removing the masking layer from the cantilever so that a dot of the catalyst remains on the cantilever at the deterministic spot; and growing a nanostructure at the deterministic spot.
Cui, Hongtao (Knoxville, TN)
10/ 930,359
August 31, 2004
[0001] The United States Government has rights in this invention pursuant to contract no. DE-AC05-00OR22725 between the United States Department of Energy and UT-Battelle, LLC.