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BEAM IMAGING SENSOR AND METHOD FOR USING SAME

United States Patent Application

*** PATENT GRANTED ***
20150129774
9,535,100
A1
View the Complete Application at the US Patent & Trademark Office
The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.
McAninch, Michael D. (Goode, VA), Root, Jeffery J. (Columbus, OH)
14/ 595,593
January 13, 2015
GOVERNMENT RIGHTS [0002] The United States Government may have rights to this invention pursuant to contract number DE-AC11-07PN38361(A) between the United States Department of Energy and Babcock & Wilcox Nuclear Operations Group, Inc.