Skip to Content
Find More Like This
Return to Search

Metrics and Semiparametric Model Estimating Failure Rate and Mean time Between Failures

United States Patent Application

View the Complete Application at the US Patent & Trademark Office
Techniques for predicting a failure metric of a physical system using a semiparametric model, including providing raw data representative of the physical system, to identify a set of units at risk in the physical system, a set of times of treatment corresponding to a event of at least one unit in the set of units, and an index-set of the at least one unit for which a event has occurred. A parametric and a nonparametric component of the semiparametric model are estimated and a hazard rate is predicted at a given time with the semiparametric model.
Teravainen, Timothy (New York, NY), Wu, Leon L. (New York, NY), Anderson, Roger N. (New York, NY), Boulanger, Albert (New York, NY)
14/ 047,879
October 7, 2013
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT [0002] This invention was made with government support under grant No. OE-OE0000197, awarded by the Department of Energy. The government has certain rights in the invention.