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High Spatial Resolution X-ray and Gamma Ray Imaging System Using Crystal Diffraction Lenses

United States Patent Application

20050175148
A1
View the Complete Application at the US Patent & Trademark Office
Argonne National Laboratory - Visit the Technology Development and Commercialization Website
A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality diffracting crystals of 1 mm width are used for focussing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.
Smither, Robert K. (Hinsdale, IL)
10/ 775,789
February 10, 2004
[0001] The United States Government has rights to this invention pursuant to Contract No. W-31-109-ENG-38 between the U.S. Department of Energy and the University of Chicago, representing Argonne National Laboratory.