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Time-of-Flight Electron Energy Analyzer

United States Patent Application

20130126727
A1
View the Complete Application at the US Patent & Trademark Office
Lawrence Berkeley National Laboratory - Visit the Technology Transfer and Intellectual Property Management Department Website
A time-of-flight (TOF) photoemission electron energy analyzer includes a TOF spectrometer for measuring an energy spectrum of a beam of electrons photoemitted from a sample and a 90 degree bend bandpass filter for spatially dispersing and filtering electrons according to energy. An exchange scattering electron spin polarimeter for detecting the spin of electrons includes an entrance aperture for admitting an electron beam, a magnetizable target positionable for receiving the electron beam at an angle relative to a target surface normal vector, a pair of Helmholtz coils positioned about the target for magnetizing the target in a selected direction, and a high-speed multi-channel plate (MCP) detector facing toward the target for receiving electrons reflected from the target surface, the MCP outputting a signal corresponding to the spin dependent intensity and time of electrons' arrivals.
Jozwiak, Christopher (Oakland, CA), Hussain, Zahid (Orinda, CA), Lanzara, Alessandra (Piedmont, CA), Lebedev, Gennadi V. (Petaluma, CA), Schmid, Andreas K. (Berkeley, CA), Andresen, Nord C. (Berkeley, CA), Graf, Jeff (Palo Alto, CA)
The Regents of the University of California (Oakland CA)
13/ 389,784
June 29, 2010
STATEMENT OF GOVERNMENTAL SUPPORT [0002] The invention described and claimed herein was made in part utilizing funds supplied by the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. The government has certain rights in this invention.