This system includes non-linear interaction imaging and spectroscopy ("NIIS") for scanning probe microscopy. Scanning probe microscopy operates with an oscillating tip and cantilever to monitor characteristics of the oscillation and NIIS measures both the linear and non-linear components of the interactions between the probe tip and the surface.
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH
 This invention was made with government support under Contract No. DE-AC05-000R22725 awarded by the U.S. Department of Energy. The government has certain rights in the invention.