Skip to Content
Find More Like This
Return to Search

APPARATUSES AND METHODS FOR ANALYSIS OF SAMPLES THROUGH MULTIPLE THICKNESSES

United States Patent Application

20120245858
A1
View the Complete Application at the US Patent & Trademark Office
Lawrence Berkeley National Laboratory - Visit the Technology Transfer and Intellectual Property Management Department Website
Apparatuses, methods, software, and systems for analyzing homogenous samples containing signal-emitting entities, such as, but not limited to, radioisotopes, are disclosed. The apparatuses mainly involve sample-container apparatuses that shape samples into different thicknesses; equipment; and software for detecting, processing, preserving, and presenting the signals and computational results. The methods mainly involve characteristic signal acquisition and processing in order to compute sample self-attenuation of signals emitted from within special sample-container apparatuses. The software intelligently pairs characteristic signals from samples of varying thicknesses; carries out the sample self-attenuation, transmittance, and other computations related to signal-detection-efficiency calibration of the detection system; and identifies and quantifies signal emitters. The systems primarily integrate and support the methods, apparatuses, and software as various embodiments that identify and quantify signal emitters within homogenous samples.
Carpenter, Scott Alan (Cupertino, CA), Gatti, Raymond C. (Oakland, CA)
NuFORENSICS, Inc.
13/ 049,903
March 17, 2011
STATEMENT OF GOVERNMENT INTEREST [0001] This invention was made with Government support under Contract No. DE-AC02-05CH11231 awarded by the United States Department of Energy. The Government has certain rights in this invention.