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METHOD AND APPARATUS FOR MEASURING PROPERTIES OF A COMPOUND

United States Patent Application

*** PATENT GRANTED ***
20110188629
8,565,376
A1
View the Complete Application at the US Patent & Trademark Office
A system that incorporates teachings of the present disclosure may include, for example, an apparatus having a collimator having at least one aperture and a fluorescence detector. The collimator can be positioned next to a compound. The compound can emit fluorescence X-rays when impacted by an X-ray beam generated by an X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescence X-rays at the at least one aperture. The second portion of the fluorescence X-rays released by the at least one aperture have known directional information based on a position of the collimator. The fluorescence detector can detect the second portion of the fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D) rendering of an elemental distribution of the compound can be determined from the fluorescence X-rays detected and the directional information. Additional embodiments are disclosed.
MENG, LING JIAN (CHAMPAIGN, IL)
BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS (URBANA IL)
12/ 986,160
January 6, 2011
STATEMENT AS TO FEDERALLY SPONSORED RESEARCH [0002] This invention was made with government support under DE-AC02-06CH11357 awarded by Argonne National Laboratory and the Department of Energy. The government has certain rights in this invention.