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Method and apparatus for evaluating materials using prompt gamma ray analysis

United States Patent Application

20030161431
A1
View the Complete Application at the US Patent & Trademark Office
Idaho National Laboratory - Visit the Technology Transfer and Commercialization Office Website
A method for evaluating a material specimen according to one embodiment of the present invention may comprise: Bombarding the material specimen with neutrons to create prompt gamma rays within the material specimen, some of the prompt gamma rays being emitted from the material specimen, some of the prompt gamma rays resulting in the formation of positrons within the material specimen by pair production; detecting at least one emitted prompt gamma ray; detecting at least one emitted annihilation gamma ray resulting from the annihilation of a positron; and calculating positron lifetime data based on the detected emitted prompt gamma ray and the detected emitted annihilation gamma ray.
Akers, Douglas W. (Idaho Falls, ID)
10/ 383,096
March 5, 2003
[0002] This invention was made with Government support under Contract DE-AC0799ID13727 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.